DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design

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DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design
Building a high-performance microprocessor presents many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that work reliably in varied (and occasionally adverse) operating conditions. To further complicate this task, deep submicron fabrication technologies present new reliability challenges in the form of degraded signal quality and logic failures caused by natural radiation interference. In this paper, we introduce dynamic verification, a novel microarchitectural technique that can significantly reduce the burden of correctness in microprocessor designs. The approach works by augmenting the commit phase of the processor pipeline with a functional checker unit. The functional checker verifies the correctness of the core processor's computation, only permitting correct results to commit. Overall design cost can be dramatically reduced because designers need only verify the correctness of the checker unit. We detai...
Todd M. Austin
Added 04 Aug 2010
Updated 04 Aug 2010
Type Conference
Year 1999
Authors Todd M. Austin
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