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ASPDAC
2010
ACM

A fast analog mismatch analysis by an incremental and stochastic trajectory piecewise linear macromodel

3 years 2 months ago
A fast analog mismatch analysis by an incremental and stochastic trajectory piecewise linear macromodel
To cope with an increasing complexity when analyzing analog mismatch in sub-90nm designs, this paper presents a fast non-MonteCarlo method to calculate mismatch in time domain. The local random mismatch is described by a noise source with an explicit dependence on geometric parameters, and is further expanded by stochastic orthogonal polynomials (SOPs). This forms a stochastic differential-algebra-equation (SDAE). To deal with large-scale problems, the SDAE is linearized at a number of snapshots along the nominal transient trajectory, and hence is naturally embedded into a trajectory-piecewise-linear (TPWL) macromodeling. The TPWL is improved with a novel incremental aggregation of subspaces identified at those snapshots. Experiments show that the proposed method, isTPWL, is hundreds of times faster than MonteCarlo method with a similar accuracy. In addition, our macromodel further reduces runtime by up to 25X, and is faster to build and more accurate to simulate compared to existing ...
Hao Yu, Xuexin Liu, Hai Wang, Sheldon X.-D. Tan
Added 10 Feb 2011
Updated 10 Feb 2011
Type Journal
Year 2010
Where ASPDAC
Authors Hao Yu, Xuexin Liu, Hai Wang, Sheldon X.-D. Tan
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