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DATE
2006
IEEE

Hierarchy-aware and area-efficient test infrastructure design for core-based system chips

13 years 10 months ago
Hierarchy-aware and area-efficient test infrastructure design for core-based system chips
Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinis
Added 10 Jun 2010
Updated 10 Jun 2010
Type Conference
Year 2006
Where DATE
Authors Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty
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