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SIGGRAPH
1992
ACM

Measuring and modeling anisotropic reflection

12 years 3 months ago
Measuring and modeling anisotropic reflection
A new device for measuringthe spatial reflectancedistributionsof surfaces is introduced, along with a new mathematical model of sniaorropic reflectance. The reflectance model presented is both simple and accurate, permitting efficient reflectance data reduction rasdreproduction. Tire validity of the model is substantiated with comparisons to complete meaarsremems of surface reflectance functions gathered with the novel retlectometry device. This new device uses imaging technology to capture the entire hemisphem of reflected directions simttkarreously, which greatly accelerates the reflectance data gathering process, making it pssible to measure dozens of surfaces in the time that it used to take to do one. Example measurements and simulations are shown. and a table of fitted parameters for several surfaces is presented. General Terms: algorithms, measurement, theory, verification. CR
Gregory J. Ward
Added 10 Aug 2010
Updated 10 Aug 2010
Type Conference
Year 1992
Where SIGGRAPH
Authors Gregory J. Ward
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