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2008

Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy

8 years 11 months ago
Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, the in-focus information at the specimen's surface can be acquired over a range of images. Commonly based on a high-pass criterion, extendeddepth-of-field methods aim at combining the in-focus information from these images into a single image of the texture on the specimen's surface. The topography provided by such methods is usually limited to a map of selected in-focus pixel positions and is inherently discretized along the axial direction, which limits its use for quantitative evaluation. In this paper, we propose a method that jointly estimates the texture and topography of a specimen from a series of brightfield optical sections; it is based on an image formation model that is described by the convolution of a thick specimen model with the microscope's point spread function. The problem is ...
François Aguet, Dimitri Van De Ville, Micha
Added 15 Dec 2010
Updated 15 Dec 2010
Type Journal
Year 2008
Where TIP
Authors François Aguet, Dimitri Van De Ville, Michael Unser
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