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ISCAS
2011
IEEE

A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test

7 years 12 months ago
A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test
—A method of precise measurement of on-chip analog voltages in a mostly-digital manner, with minimal overhead, is presented. A pair of clock signals is routed to the node of an analog voltage. This analog voltage controls the delay between this pair of clock signals, which is then measured in an all-digital manner using the technique of sub-sampling. This sub-sampling technique, having measurement time and accuracy trade-off, is well suited for low bandwidth signals. This concept is validated by designing delay cells, using current starved inverters in UMC 130nm CMOS process. Sub-mV accuracy is demonstrated for a measurement time of few seconds.
Rajath Vasudevamurthy, Pratap Kumar Das, Bharadwaj
Added 21 Aug 2011
Updated 21 Aug 2011
Type Journal
Year 2011
Where ISCAS
Authors Rajath Vasudevamurthy, Pratap Kumar Das, Bharadwaj Amrutur
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