A New Model for Timing Jitter Caused by Device Noise in Current-Mode Logic Frequency Dividers

A new method for predicting timing jitter caused by device noise in current-mode logic (CML) frequency dividers is presented. Device noise transformation into jitter is modeled as a linear time-varying (LTV) process, as opposed to a previously published method, which models jitter generation as a linear time-invariant (LTI) process. Predictions obtained using the LTV method match jitter values obtained through exhaustive simulation with an error of up to 7.7 %, whereas errors of the jitter predicted by the LTI method exceed 57 %.

• Type: Conference
• Year: 2005
• Where: PATMOS
• Authors: Marko Aleksic, Nikola Nedovic, K. Wayne Current, Vojin G. Oklobdzija
• Keywords: Jitter, Method Match Jitter, PATMOS 2005, Timing Jitter