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DATE
2005
IEEE

Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach

13 years 10 months ago
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
Rabeb Kheriji, V. Danelon, Jean-Louis Carbon&eacut
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where DATE
Authors Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir
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