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DAC
1996
ACM

Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths

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Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testing problem, and the associated fault detection probabilities are derived in terms of signal probability distributions. A method of calculating these distributions is described, and it is shown how these distributions can be used to predict testing problems that arise from the correlation properties of test sequences generated using linear-feedback shift registers. Finally, it is shown empirically that variance matching using associativity transformations can reduce the number of untested faults by a factor of eight over variance mismatched designs.
Laurence Goodby, Alex Orailoglu
Added 08 Aug 2010
Updated 08 Aug 2010
Type Conference
Year 1996
Where DAC
Authors Laurence Goodby, Alex Orailoglu
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