| Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points Recent countries visiting this post |  |
 | 4 | United States |
 | 1 | Japan |
| Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points Recent countries visiting this post | |
| 4 | United States |
| 1 | Japan |