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ICCAD
2006
IEEE

Robust estimation of parametric yield under limited descriptions of uncertainty

10 years 8 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributional properties of the process data. Existing methods are inadequate when dealing with real-life distributions of process and environmental parameters, and limited availability of parameter data during early design. This paper proposes a robust technique for full-chip parametric yield estimation; the proposed work is based on the rigorous notions of non-parametric robust statistics which permits estimation based on the knowledge of the range and the limited number of moments (e.g. mean and variance) of the parameter distributions. Fully or partially specified process and environmental parameters can be described by robust representations, and used to estimate probabilistic bounds for leakage dissipation. The proposed approach is applied to estimating the chip-level parametric yield. The experimental results sh...
Wei-Shen Wang, Michael Orshansky
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2006
Where ICCAD
Authors Wei-Shen Wang, Michael Orshansky
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