2 search results - page 1 / 1 » Robust estimation of parametric yield under limited descript... |
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...