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6

ITC
1998
IEEE

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Semiconductor manufacturing process monitoring using built-in self-test for embedded memories

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Semiconductor manufacturing process monitoring using built-in self-test for embedded memories

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Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goo

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Added	05 Aug 2010
Updated	05 Aug 2010
Type	Conference
Year	1998
Where	ITC
Authors	Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen

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