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DATE
2008
IEEE

Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression

9 years 10 months ago
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
Statistical timing analysis needs a priori knowledge of process variations. Lack of such a priori knowledge of process variations prevents accurate statistical timing analysis, for which foundry confidentiality policy has largely been blamed. A significant part of process variations are design specific, and can only be extracted from production chip performance statistics. In this paper, I adopt the homogeneous isotropic random field model for intra-die random variations, apply fast Fourier transform (FFT) to simulate a homogeneous isotropic random field, obtain corners for Monte Carlo SPICE simulation of timing critical paths in a VLSI circuit, and apply regression to match production chip performance statistics. Experimental results based on a timing critical path in an industry design with 65nm Predictive Technology Models reveal constant mean, increased standard deviation, and decreased skewness of a signal propagation path delay as spatial correlation increases. The proposed...
Bao Liu
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DATE
Authors Bao Liu
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