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2008
IEEE

Specification-based compaction of directed tests for functional validation of pipelined processors

8 years 11 months ago
Specification-based compaction of directed tests for functional validation of pipelined processors
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biased-random test programs. Although directed tests require a smaller test set compared to random tests to achieve the same functional coverage goal, there is a lack of automated techniques for directed test generation. Furthermore, the number of directed tests can still be prohibitively large. This paper presents a methodology for specification-based coverage analysis and test generation. The primary contribution of this paper is a compaction technique that can drastically reduce the required number of directed test programs to achieve a coverage goal. Our experimental results using a MIPS processor and an industrial processor (e500) demonstrate more than 90% reduction in number of directed tests without sacrificing the functional coverage goal. Categories and Subject Descriptors: B.6.3 [Logic Design]: Design Ai...
Heon-Mo Koo, Prabhat Mishra
Added 18 Oct 2010
Updated 18 Oct 2010
Type Conference
Year 2008
Where CODES
Authors Heon-Mo Koo, Prabhat Mishra
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