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DAC
2004
ACM

Statistical timing analysis based on a timing yield model

10 years 1 months ago
Statistical timing analysis based on a timing yield model
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied to estimation of the timing yield. Key features of these models are that they are easy to compute, they include a powerful model of withindie correlation, and they are "full-chip" models in the sense that they can be applied with ease to circuits with millions of components. As such, these models provide a way to do statistical timing analysis without the need for detailed statistical analysis of every path in the design. Categories and Subject Descriptors B.7 [Integrated Circuits]: Design Aids General Terms Algorithms, Design, Theory Keywords Statistical timing analysis, timing yield, principal components
Farid N. Najm, Noel Menezes
Added 13 Nov 2009
Updated 13 Nov 2009
Type Conference
Year 2004
Where DAC
Authors Farid N. Najm, Noel Menezes
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