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2004
IEEE

A stochastic integral equation method for modeling the rough surface effect on interconnect capacitance

9 years 9 months ago
A stochastic integral equation method for modeling the rough surface effect on interconnect capacitance
In this paper we describe a stochastic integral equation method for computing the mean value and the variance of capacitance of interconnects with random surface roughness. An ensemble average Green’s function is combined with a matrix Neumann expansion to compute nominal capacitance and its variance. This method avoids the time-consuming Monte Carlo simulations and the discretization of rough surfaces. Numerical experiments show that the results of the new method agree very well with Monte Carlo simulation results.
Zhenhai Zhu, Jacob White, Alper Demir
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2004
Where ICCAD
Authors Zhenhai Zhu, Jacob White, Alper Demir
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