5 search results - page 1 / 1 » A stochastic integral equation method for modeling the rough... |
ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
In this paper we describe a stochastic integral equation method for computing the mean value and the variance of capacitance of interconnects with random surface roughness. An ens...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper we describe several novel sparsification techniques used in a Fast Stochastic Integral Equation Solver to compute the mean value and the variance of capacitance of ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— As clock frequencies exceed giga-Hertz, the extra power loss due to conductor surface roughness in interconnects and packagings is more evident and thus demands a proper accou...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
—1 In this paper we present a stochastic model order reduction technique for interconnect extraction in the presence of process variabilities, i.e. variation-aware extraction. It...
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
Interconnect structures including dielectrics can be modeled by an integral equation method using volume currents and surface charges for the conductors, and volume polarization c...