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DATE
2003
IEEE

Test Data Compression: The System Integrator's Perspective

10 years 9 months ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but also the bandwidth requirements. In this paper we provide a quantitative analysis of two distinctive TDC methods from the system integrator’s standpoint considering a core based SOC environment. The proposed analysis addresses four parameters: compression ratio, test application time, area overhead and power dissipation. Based on our analysis, some future research directions are given which can lead to an easier integration of TDC in the SOC design flow and to further improve the four parameters.
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where DATE
Authors Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici
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