Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...
ThelinkagesbetweenISandbusinessunitsarerecognizedasbeingcriticaltoinformationsystemsdevelopment processes and outcomes. Previous research has found that they are associated with b...
Amrit Tiwana, Anandhi S. Bharadwaj, V. Sambamurthy
In this article, we present the AdOC (Adaptive Online Compression) library. It is a user-level set of functions that enables data transmission with compression. The compression is...
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...