532 search results - page 1 / 107 » Test Data Compression: The System Integrator's Perspective |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
ICIS
2003
13 years 6 months ago
2003
ThelinkagesbetweenISandbusinessunitsarerecognizedasbeingcriticaltoinformationsystemsdevelopment processes and outcomes. Previous research has found that they are associated with b...
IPPS
2005
IEEE
2005
IEEE
Improving Middleware Performance with AdOC: An Adaptive Online Compression Library for Data Transfer
13 years 10 months ago
In this article, we present the AdOC (Adaptive Online Compression) library. It is a user-level set of functions that enables data transmission with compression. The compression is...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...