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Using GLFSRs for Pseudo-Random Memory BIST

12 years 6 months ago
Using GLFSRs for Pseudo-Random Memory BIST
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Recently, it was shown that using GLFSRs as pattern generators for pseudo-random logic tests can increase the fault coverage noticeably in comparison to standard pseudo-random test pattern generators. Since memory faults differ from logic faults, we examined if that is also the case for pseudo-random memory tests. We found that GLFSRs can increase the fault coverage of pseudo-random tests for several fault types, especially for complex faults as stuck-open faults. Thus, the usage of GLFSRs as pattern generators for pseudo-random memory testing is recommended although some area overhead has to be accepted.
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk
Added 01 Aug 2010
Updated 01 Aug 2010
Type Conference
Year 2000
Where MTDT
Authors Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer
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