MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...