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ICCAD
2009
IEEE

Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits

9 years 1 months ago
Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die variations in nanoscale manufacturing process. VP exploits recent breakthroughs in compressed sensing [15]-[17] to accurately predict spatial variations from an exceptionally small set of measurement data, thereby reducing the cost of silicon characterization. By exploring the underlying sparse structure in (spatial) frequency domain, VP achieves substantially lower sampling frequency than the wellknown (spatial) Nyquist rate. In addition, VP is formulated as a linear programming problem and, therefore, can be solved both robustly and efficiently. Our industrial measurement data demonstrate that by testing the delay of just 50 chips on a wafer, VP accurately predicts the delay of the other 219 chips on the same wafer. In this example, VP reduces the estimation error by up to 10
Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton
Added 18 Feb 2011
Updated 18 Feb 2011
Type Journal
Year 2009
Where ICCAD
Authors Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton
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