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    ISQED
    2007
    IEEE
    104views Hardware» more  ISQED 2007»
    A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances
    13 years 11 months ago
    A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances
    Download  www.isqed.org
    Andrew B. Kahng, Rasit Onur Topaloglu
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    VLSID
    2007
    IEEE
    103views VLSI» more  VLSID 2007»
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    14 years 5 months ago
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    Download  www.eecs.northwestern.edu
    Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
    Debjit Sinha, Jianfeng Luo, Subramanian Rajagopala...
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