103 search results - page 20 / 21 » A Fault Modeling Technique to Test Memory BIST Algorithms |
LCTRTS
2009
Springer
14 years 16 days ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
FPGA
2009
ACM
14 years 16 days ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...
AMOST
2007
ACM
13 years 9 months ago
2007
ACM
Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checker...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
Abstract. Artificial immune systems (AISs) are problem-solving systems inspired by the biological immune system. They have been successfully applied to a number of problem domains ...
SIGMOD
2007
ACM
14 years 5 months ago
2007
ACM
Graphs are prevalently used to model the relationships between objects in various domains. With the increasing usage of graph databases, it has become more and more demanding to e...