3 search results - page 1 / 1 » A Flexible Design Methodology for Analog Test Wrappers in Mi... |
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...