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DATE
2006
IEEE
78views Hardware» more  DATE 2006»
13 years 11 months ago
Functional constraints vs. test compression in scan-based delay testing
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
Ilia Polian, Hideo Fujiwara
ICCD
2003
IEEE
145views Hardware» more  ICCD 2003»
14 years 2 months ago
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
Bernd Könemann
CORR
2006
Springer
91views Education» more  CORR 2006»
13 years 5 months ago
Universal Codes as a Basis for Time Series Testing
We suggest a new approach to hypothesis testing for ergodic and stationary processes. In contrast to standard methods, the suggested approach gives a possibility to make tests, ba...
Boris Ryabko, Jaakko Astola
ICCD
2004
IEEE
109views Hardware» more  ICCD 2004»
14 years 2 months ago
Low Power Test Data Compression Based on LFSR Reseeding
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
Jinkyu Lee, Nur A. Touba
IAJIT
2010
211views more  IAJIT 2010»
13 years 3 months ago
3D Model Retrieval Based on 3D Discrete Cosine Transform
: The content-based retrieval systems for 3D models on the Web become necessary since digital databases of 3D objects are growing. In this paper, we propose a new method to describ...
Elmustapha Ait Lmaati, Ahmed El Oirrak, Mohammed N...