12 search results - page 3 / 3 » A Methodology for Concurrent Fabrication Process Cell Librar... |
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
EMSOFT
2007
Springer
14 years 4 days ago
2007
Springer
In networked control systems the controller of a physicallydistributed plant is implemented as a collection of tightlyinteracting, concurrent processes running on a distributed ex...