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DATE
2002
IEEE
98views Hardware» more  DATE 2002»
13 years 10 months ago
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
ATS
2005
IEEE
164views Hardware» more  ATS 2005»
13 years 7 months ago
A Family of Logical Fault Models for Reversible Circuits
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 5 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
EMMCVPR
2011
Springer
12 years 5 months ago
Branch and Bound Strategies for Non-maximal Suppression in Object Detection
In this work, we are concerned with the detection of multiple objects in an image. We demonstrate that typically applied objectives have the structure of a random field model, but...
Matthew B. Blaschko
GECCO
2004
Springer
13 years 10 months ago
Improving Generalisation Performance Through Multiobjective Parsimony Enforcement
This paper describes POPE-GP, a system that makes use of the NSGA-II multiobjective evolutionary algorithm as an alternative, parameter-free technique for eliminating program bloat...
Yaniv Bernstein, Xiaodong Li, Victor Ciesielski, A...