ATS 2005 - PDF Preprint Papers

ATS 2005 Asian Test Symposium

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ATS
2005
IEEE

191views Hardware» more ATS 2005»

Low Transition LFSR for BIST-Based Applications

13 years 10 months ago

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Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...

Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed

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Id	Views	Title	Status

1	191	Low Transition LFSR for BIST-Based Applications	claim
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