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ATS   2005 Asian Test Symposium
Wall of Fame | Most Viewed ATS-2005 Paper
ATS
2005
IEEE
191views Hardware» more  ATS 2005»
9 years 11 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
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