22 search results - page 3 / 5 » A New Functional Fault Model for FPGA Application-Oriented T... |
TCAD
2008
13 years 6 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ICES
2005
Springer
13 years 11 months ago
2005
Springer
While the fault repair capability of Evolvable Hardware (EH) approaches have been previously demonstrated, further improvements to fault handling capability can be achieved by exp...
INFSOF
2007
13 years 6 months ago
2007
: Correct functioning of object-oriented software depends upon the successful integration of classes. While individual classes may function correctly, several new faults can arise ...
ICCD
2003
IEEE
13 years 11 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
ASC
2011
13 years 1 months ago
2011
A new paradigm for online EH regeneration using Genetic Algorithms (GAs) called Competitive Runtime Reconfiguration (CRR) is developed where performance is assessed based upon a b...