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DFT
2002
IEEE
127views VLSI» more  DFT 2002»
13 years 10 months ago
A New Functional Fault Model for FPGA Application-Oriented Testing
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...
RAM
2008
IEEE
95views Robotics» more  RAM 2008»
13 years 11 months ago
A New Distance Algorithm and Its Application to General Force-Closure Test
This paper presents an algorithm for computing the distance between a point and a convex cone in n-dimensional space. The convex cone is specified by the set of all nonnegative com...
Yu Zheng, Chee-Meng Chew
BMCBI
2006
148views more  BMCBI 2006»
13 years 5 months ago
Exploiting the full power of temporal gene expression profiling through a new statistical test: Application to the analysis of m
Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...
Veronica Vinciotti, Xiaohui Liu, Rolf Turk, Emile ...
ECRTS
2009
IEEE
13 years 3 months ago
Implementation of a Speedup-Optimal Global EDF Schedulability Test
A recent result in [13] has demonstrated the existence of a sufficient global EDF schedulability test for sporadic task systems that makes the following guarantee: any task system...
Sanjoy K. Baruah, Vincenzo Bonifaci, Alberto March...
JMLR
2012
11 years 7 months ago
Bayesian Comparison of Machine Learning Algorithms on Single and Multiple Datasets
We propose a new method for comparing learning algorithms on multiple tasks which is based on a novel non-parametric test that we call the Poisson binomial test. The key aspect of...
Alexandre Lacoste, François Laviolette, Mar...