81 search results - page 2 / 17 » A SPICE model for single electronics |
ISQED
2005
IEEE
13 years 11 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
EH
2000
IEEE
13 years 9 months ago
2000
IEEE
The differences between electronics design through artificial evolution and through conventional methods have the consequence that evolved circuits may take unusual leverage from ...
MVA
2007
13 years 6 months ago
2007
It is very important to guarantee the quality of the industrial products by means of visual inspection. In order to reduce the soldering defect with terminal deformation and termi...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
— Trajectory-based methods offer an attractive methodology for automated, on-demand generation of macromodels for custom circuits. These models are generated by sampling the stat...
MR
2006
13 years 5 months ago
2006
Power electronic devices are susceptible to catastrophic failures when they are exposed to energetic particles; the most serious failure mechanism is single event burnout (SEB). S...