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DFT
2009
IEEE
127views VLSI» more  DFT 2009»
13 years 11 months ago
A Sensor to Detect Normal or Reverse Temperature Dependence in Nanoscale CMOS Circuits
The temperature dependence of MOSFET drain current varies with supply voltage. Two distinct voltage regions exist—a normal dependence (ND) region where an increase in temperatur...
David Wolpert, Paul Ampadu
DATE
2010
IEEE
161views Hardware» more  DATE 2010»
13 years 10 months ago
Aging-resilient design of pipelined architectures using novel detection and correction circuits
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Hamed F. Dadgour, Kaustav Banerjee