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TVLSI
2008
105views more  TVLSI 2008»
13 years 6 months ago
Fast Estimation of Timing Yield Bounds for Process Variations
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
Ruiming Chen, Hai Zhou
DATE
2006
IEEE
127views Hardware» more  DATE 2006»
14 years 7 days ago
A signal theory based approach to the statistical analysis of combinatorial nanoelectronic circuits
In this paper we present a method which allows the statistical analysis of nanoelectronic Boolean networks with respect to timing uncertainty and noise. All signals are considered...
Oliver Soffke, Peter Zipf, Tudor Murgan, Manfred G...
CAIP
2009
Springer
209views Image Analysis» more  CAIP 2009»
13 years 10 months ago
Total Variation Processing of Images with Poisson Statistics
This paper deals with denoising of density images with bad Poisson statistics (low count rates), where the reconstruction of the major structures seems the only reasonable task. Ob...
Alex Sawatzky, Christoph Brune, Jahn Müller, ...
ISBI
2004
IEEE
14 years 6 months ago
Wavelet-Based fMRI Statistical Analysis and Spatial Interpretation: A Unifying Approach
Wavelet-based statistical analysis methods for fMRI are able to detect brain activity without smoothing the data. Typically, the statistical inference is performed in the wavelet ...
Dimitri Van De Ville, Thierry Blu, Michael Unser
ICASSP
2011
IEEE
12 years 10 months ago
Denoising of image patches via sparse representations with learned statistical dependencies
We address the problem of denoising for image patches. The approach taken is based on Bayesian modeling of sparse representations, which takes into account dependencies between th...
Tomer Faktor, Yonina C. Eldar, Michael Elad