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» A Statistical Model for Electromigration Failures
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BMCBI
2010
150views more  BMCBI 2010»
13 years 2 months ago
Kernel based methods for accelerated failure time model with ultra-high dimensional data
Background: Most genomic data have ultra-high dimensions with more than 10,000 genes (probes). Regularization methods with L1 and Lp penalty have been extensively studied in survi...
Zhenqiu Liu, Dechang Chen, Ming Tan, Feng Jiang, R...
ICCD
2007
IEEE
125views Hardware» more  ICCD 2007»
14 years 2 months ago
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
DAC
2008
ACM
14 years 6 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
HICSS
2006
IEEE
118views Biometrics» more  HICSS 2006»
13 years 11 months ago
An Estimator of Propagation of Cascading Failure
— We suggest a statistical estimator to measure the extent to which failures propagate in cascading failures such as large blackouts. The estimator is tested on a saturating bran...
Ian Dobson, Kevin R. Wierzbicki, Benjamin A. Carre...
PET
2012
Springer
11 years 7 months ago
Fault-Tolerant Privacy-Preserving Statistics
Real-time statistics on smart meter consumption data must preserve consumer privacy and tolerate smart meter failures. Existing protocols for this private distributed aggregation m...
Marek Jawurek, Florian Kerschbaum