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ICCD
2007
IEEE

Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor

9 years 9 months ago
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only relevant fault model. The delay fault model —- which assumes that the faulty circuit element gets the correct value but that this value arrives too late — encompasses many of the actual in-field wearout faults in modern microprocessors. In-field wearout faults, such as time-dependent dielectric breakdown and electromigration, cause signal propagation delays which may be missed during production test time. These defects progress exponentially over time, potentially causing a catastrophic failure. Our goal is to diagnose hard delay faults (i.e., identify them as hard faults, not transients) during run-time before they lead to catastrophic chip failures. Results show that we can diagnose all injected delay faults and that prior diagnosis mechanisms, which target only stuck-at faults, miss the majority of the...
Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
Added 16 Mar 2010
Updated 16 Mar 2010
Type Conference
Year 2007
Where ICCD
Authors Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
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