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ITC
1997
IEEE
107views Hardware» more  ITC 1997»
13 years 9 months ago
On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
Benoît R. Veillette, Gordon W. Roberts
WWW
2003
ACM
14 years 6 months ago
Techniques and Metrics for Improving Website Structure
In this work two distinct metrics are proposed, which aim to quantify the importance of a web page based on the visits it receives by the users and its location within the website...
Eleni Christopoulou, John D. Garofalakis, Christos...
CCS
2009
ACM
13 years 9 months ago
Dynamic integrity measurement and attestation: towards defense against return-oriented programming attacks
Despite the many efforts made in recent years to mitigate runtime attacks such as stack and heap based buffer overflows, these attacks are still a common security concern in today...
Lucas Davi, Ahmad-Reza Sadeghi, Marcel Winandy
HAPTICS
2007
IEEE
13 years 11 months ago
Development of a Whole-Sensitive Teleoperated Robot Arm using Torque Sensing Technique
In this paper, we concentrate on the design of a new whole-sensitive robot arm enabling torque measurement in each joint by means of developed optical torque sensors. When the con...
Dzmitry Tsetserukou, Riichiro Tadakuma, Hiroyuki K...
ITC
2000
IEEE
68views Hardware» more  ITC 2000»
13 years 9 months ago
Current ratios: a self-scaling technique for production IDDQ testing
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, ...