158 search results - page 2 / 32 » A Test Pattern Generation Algorithm Exploiting Behavioral In... |
DMIN
2008
13 years 6 months ago
2008
Abstract - The rapid advances of wireless and web technologies enable the mobile users to request various kinds of services via mobile devices at anytime and anywhere. To provide t...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
AIPS
1994
13 years 6 months ago
1994
MostAI representations and algorithms for plan generation havenot included the concept of informationproducingactions (also called diagnostics, or tests, in the decision making li...
DELTA
2008
IEEE
13 years 7 months ago
2008
IEEE
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...