—As semiconductor technology scales into the deep submicron regime the occurrence of transient or soft errors will increase. This will require new approaches to error detection. ...
This paper addresses two aspects of low-power design for FPGA circuits. First, we present an RT-level power estimator for FPGAs with consideration of wire length. The power estima...
The Architectural Vulnerability Factor (AVF) of a hardware structure is the probability that a fault in the structure will affect the output of a program. AVF captures both microa...