18 search results - page 4 / 4 » A design methodology for temperature variation insensitive l... |
DAC
2006
ACM
14 years 6 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
SLIP
2009
ACM
13 years 11 months ago
2009
ACM
A novel high-level approach for estimating power consumption of global interconnects in data-path oriented designs implemented in FPGAs is presented. The methodology is applied to...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...