23 search results - page 2 / 5 » A fast simulation approach for inductive effects of VLSI int... |
ICCD
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— Noise induced by impedance discontinuities from VLSI packaging is one of the leading challenges facing system level designers in the next decade. The performance of IC ...
VLSID
2000
IEEE
13 years 9 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
ISCAS
2006
IEEE
13 years 10 months ago
2006
IEEE
As the operation frequency reaches gigahertz in very deep-submicron designs, the effect of on-chip inductance on circuit performance can no longer be neglected. Therefore, it is d...
DAC
2003
ACM
14 years 5 months ago
2003
ACM
Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC netw...
ISCAS
1999
IEEE
13 years 9 months ago
1999
IEEE
- A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range o...