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ICCAD
1996
IEEE
13 years 8 months ago
1996
IEEE
Although numerous methods have been proposed for interconnect simulation, no single model exists for all kind of transmission line problems. This paper presents a new, single, gen...
VLSID
2000
IEEE
13 years 9 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...