8 search results - page 1 / 2 » A modular test structure for CMOS mismatch characterization |
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
In this work a new test structure for mismatch characterization of CMOS technologies is presented. The test structure is modular, with a reduced area and it can be inserted in the...
DFT
1998
IEEE
13 years 9 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
WCRE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—The principles and best practices of object oriented design require that modules in a program should match logical decomposition of the knowledge that the program implem...
BMCBI
2008
13 years 5 months ago
2008
Background: Structural similarities among proteins can provide valuable insight into their functional mechanisms and relationships. As the number of available three-dimensional (3...