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VTS   2008 IEEE VLSI Test Symposium
Wall of Fame | Most Viewed VTS-2008 Paper
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
8 years 9 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
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