8 search results - page 1 / 2 » A modular test structure for CMOS mismatch characterization |
ISCAS
2003
IEEE
13 years 11 months ago
2003
IEEE
In this work a new test structure for mismatch characterization of CMOS technologies is presented. The test structure is modular, with a reduced area and it can be inserted in the...
DFT
1998
IEEE
13 years 10 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
VTS
2008
IEEE
14 years 4 days ago
2008
IEEE
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
WCRE
2009
IEEE
14 years 15 days ago
2009
IEEE
Abstract—The principles and best practices of object oriented design require that modules in a program should match logical decomposition of the knowledge that the program implem...
BMCBI
2008
13 years 5 months ago
2008
Background: Structural similarities among proteins can provide valuable insight into their functional mechanisms and relationships. As the number of available three-dimensional (3...