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» A modular test structure for CMOS mismatch characterization
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DATE
2008
IEEE
174views Hardware» more  DATE 2008»
13 years 11 months ago
Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
Mustafa Badaroglu, Guy Decabooter, Francois Laulan...
IROS
2008
IEEE
131views Robotics» more  IROS 2008»
13 years 11 months ago
OpenRDK: A modular framework for robotic software development
— Intense efforts to define a common structure in robotic applications, both from a conceptual and from an implementation point of view, have been carried out in the last years ...
Daniele Calisi, Andrea Censi, Luca Iocchi, Daniele...
IPSN
2007
Springer
13 years 11 months ago
Lucid dreaming: reliable analog event detection for energy-constrained applications
— Existing sensor network architectures are based on the assumption that data will be polled. Therefore, they are not adequate for long-term battery-powered use in applications t...
Sasha Jevtic, Mathew Kotowsky, Robert P. Dick, Pet...