3 search results - page 1 / 1 » A multi-level approach to reduce the impact of NBTI on proce... |
GLVLSI
2010
IEEE
13 years 9 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
MICRO
2003
IEEE
13 years 10 months ago
2003
IEEE
Wire delays are a major concern for current and forthcoming processors. One approach to attack this problem is to divide the processor into semi-independent units referred to as c...
MICRO
1999
IEEE
13 years 9 months ago
1999
IEEE
Building a high-performance microprocessor presents many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that ...