IC manufacturing process variations are typically expressed in terms of joint probability density functions (jpdf’s) or as worst case combinations/corners of the device model pa...
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun,...
This paper presents novel methodologies which allow robust secret key extraction from radio channel measurements which suffer from real-world non-reciprocities and a priori unkno...
—We present new results from Computational Neurogenetic Modeling to aid discoveries of complex gene interactions underlying oscillations in neural systems. Interactions of genes ...
Lubica Benuskova, Simei Gomes Wysoski, Nikola K. K...
Background: Synthetic lethality experiments identify pairs of genes with complementary function. More direct functional associations (for example greater probability of membership...