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ICCV
2001
IEEE
14 years 6 months ago
Markov Face Models
The spatial distribution of gray level intensities in an image can be naturally modeled using Markov Random Field (MRF) models. We develop and investigate the performance of face ...
Sarat C. Dass, Anil K. Jain
DATE
2010
IEEE
171views Hardware» more  DATE 2010»
13 years 9 months ago
Digital statistical analysis using VHDL
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Manfred Dietrich, Uwe Eichler, Joachim Haase
ESANN
2004
13 years 6 months ago
Sparse LS-SVMs using additive regularization with a penalized validation criterion
This paper is based on a new way for determining the regularization trade-off in least squares support vector machines (LS-SVMs) via a mechanism of additive regularization which ha...
Kristiaan Pelckmans, Johan A. K. Suykens, Bart De ...
ISPASS
2010
IEEE
13 years 11 months ago
Synthesizing memory-level parallelism aware miniature clones for SPEC CPU2006 and ImplantBench workloads
Abstract—We generate and provide miniature synthetic benchmark clones for modern workloads to solve two pre-silicon design challenges, namely: 1) huge simulation time (weeks to m...
Karthik Ganesan, Jungho Jo, Lizy K. John