The spatial distribution of gray level intensities in an image can be naturally modeled using Markov Random Field (MRF) models. We develop and investigate the performance of face ...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
This paper is based on a new way for determining the regularization trade-off in least squares support vector machines (LS-SVMs) via a mechanism of additive regularization which ha...
Kristiaan Pelckmans, Johan A. K. Suykens, Bart De ...
Abstract—We generate and provide miniature synthetic benchmark clones for modern workloads to solve two pre-silicon design challenges, namely: 1) huge simulation time (weeks to m...